Good news, part number 356A1426P8 with NSN 5962015203147 is now available. This part number 356A1426P8 is manufactured by Bae Systems Controls Inc and is described as Microcircuit Memory. Do you need a quick quote for 356A1426P8? We can help! Our ready-to-ship stock is comprised of over 2 billion NSN items.
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5962-01-520-3147 Item Description: Microcircuit Memory | 5962 | 015203147 | 0 | N | B | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | B | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| 356a1426p8 | 5 | 2 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| AFGA | OPERATING TEMP RANGE | -55.0/+125.0 DEG CELSIUS |
| ADAU | BODY HEIGHT | 1.1 MILLIMETERS MINIMUM AND 1.2 MILLIMETERS MAXIMUM |
| TEST | TEST DATA DOCUMENT | 89954-356A1407 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING) |
| CBBL | FEATURES PROVIDED | ELECTROSTATIC SENSITIVE |
| ADAQ | BODY LENGTH | 13.5 MILLIMETERS MINIMUM AND 14.5 MILLIMETERS MAXIMUM |
| ADAT | BODY WIDTH | 13.5 MILLIMETERS MINIMUM AND 14.5 MILLIMETERS MAXIMUM |
| AGAV | END ITEM IDENTIFICATION | C-17A AIRCRAFT |
| CQSJ | INCLOSURE MATERIAL | PLASTIC |
| CQWX | OUTPUT LOGIC FORM | COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC |
| CXCY | PART NAME ASSIGNED BY CONTROLLING AGENCY | MICROCIRCUIT MEMORY, PROGRAMABLE LOGIC DEVICE |
| CZEQ | TIME RATING PER CHACTERISTIC | 7.50 NANOSECONDS MAXIMUM PROPAGATION DELAY |
| CZZZ | MEMORY CAPACITY | 2500GATES |
| TTQY | TERMINAL TYPE AND QUANTITY | 100 GULLWING |
| CZEP | CAPITANCE RATING PER CHARACTERISTIC | 10.00 INPUT PICOFARADS MAXIMUM AND 10.00 OUTPUT PICOFARADS MAXIMUM |
| CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -2.0 VOLTS MAXIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
| AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
| CRTL | CRITICALITY CODE JUSTIFICATION | CBBL |
| SPCL | SPECIAL TEST FEATURES | UPSCREENING TESTING CONSISTING OF EXTENDED TEMPERATURE RANGE TESTING |
| CZER | MEMORY DEVICE TYPE | EEPROM |
| CQSZ | INCLOSURE CONFIGURATION | LEADED CHIP CARRIER |
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