IDT7202SA120DM Part with NSN 5962-01-287-2391 by Integrated Device Technology Inc – Buy Now

Name: Part Number IDT7202SA120DM - Microcircuit Memory
Brand: Integrated Device Technology Inc
SKU: idt7202sa120dm
Availability: InStock
Rating: 4.6 (226 reviews)

Part Number: IDT7202SA120DM

NSN: 5962-01-287-2391 (5962012872391)

Item Name: Microcircuit Memory

Manufacturer: Integrated Device Technology Inc

CAGE Code: 61772

FSC: 5962 Microcircuits Electronic

NIIN: 012872391

Good news, part number IDT7202SA120DM with NSN 5962012872391 is now available. This part number IDT7202SA120DM is manufactured by Integrated Device Technology Inc and is described as Microcircuit Memory. Do you need a quick quote for IDT7202SA120DM? We can help! Our ready-to-ship stock is comprised of over 2 billion NSN items.

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NSN Information for Part Number IDT7202SA120DM with NSN 5962-01-287-2391, 5962012872391

NSN	FSC	NIIN	CLS	Hazmat	DEMIL	Cancelled NSN
5962-01-287-2391 Item Description: Microcircuit Memory	5962	012872391	0	N	B
	CIIC	HCC	ESD	PMIC	Criticality	ENAC
	U		B	A	0
Part Number	ISC	RNVC	RNCC	HCC	MSDS	SADC
Idt7202sa120dm	5	8	E

Characteristics Data of NSN 5962-01-287-2391, 5962012872391

MRC	Criteria	Characteristic
ADAQ	BODY LENGTH	1.380 INCHES MINIMUM AND 1.420 INCHES MAXIMUM
ADAT	BODY WIDTH	0.560 INCHES MINIMUM AND 0.600 INCHES MAXIMUM
ADAU	BODY HEIGHT	0.040 INCHES MINIMUM AND 0.180 INCHES MAXIMUM
AEHX	MAXIMUM POWER DISSIPATION RATING	1.0 WATTS
AFGA	OPERATING TEMP RANGE	-55.0/+125.0 DEG CELSIUS
AFJQ	STORAGE TEMP RANGE	-65.0/+155.0 DEG CELSIUS
CBBL	FEATURES PROVIDED	ELECTROSTATIC SENSITIVE AND HERMETICALLY SEALED AND BURN IN AND MONOLITHIC
CQSJ	INCLOSURE MATERIAL	CERAMIC
CQSZ	INCLOSURE CONFIGURATION	DUAL-IN-LINE
CQWX	OUTPUT LOGIC FORM	COMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
CQZP	INPUT CIRCUIT PATTERN	14 INPUT
CWSG	TERMINAL SURFACE TREATMENT	SOLDER
CZEN	VOLTAGE RATING AND TYPE PER CHARACTERISTIC	-0.5 VOLTS MINIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE
CZEQ	TIME RATING PER CHACTERISTIC	140.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 140.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT
CZER	MEMORY DEVICE TYPE	ROM
TEST	TEST DATA DOCUMENT	96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.).
TTQY	TERMINAL TYPE AND QUANTITY	28 PRINTED CIRCUIT

5711152-26

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